[HI Jena Seminar] Characterizing ultra-low emittance electron beams using structured light fields

durch Andreas Seidel

Mittwoch 20.01.2021, 16:00 → 17:00 Europe/Berlin

I will present a novel, highly sensitive method for the single-shot characterization of the electron beam waist and emittance using interfering laser beams. In this scheme, two laser pulses are focused under an angle creating a grating-like interference pattern. When the electron beam interacts with the structured laser field, the phase space of the electron beam becomes modulated by the laser ponderomotive force and results in a modulated beam profile after further electron beam phase advance, which allows for the characterization of ultra-low emittance beams. 2D PIC simulations show the effectiveness of the technique for normalized emittances in the range of [0.01, 1] mm mrad.

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