5-10 May 2019
Europe/Berlin timezone

A novel method for measuring ultra-low emittance electron beams using structured light fields

Not scheduled


Meštrovićevo šetalište 45 HR – 21000 Split Republic of Croatia


Mr Andreas Seidel (Friedrich-Schiller-Universität)


Schemes for generating ultra-low emittance beams have been developed in the last years with applications, for example, in high-energy physics and free-electron laser science. Current methods for the characterization of low emittance beams such as pepperpot measurements or quadrupole scans are limit to about $e_n\approx0.2\pi$ $mm$ $mrad$. Here we propose a novel method for the characterization of ultra-low emittance beams using structured light fields. In this scheme, two laser pulses are focused under an angle creating a grating-like intensity pattern. When the electron beam interacts with the structured light field, the phase space of the electron beam becomes modulated. By measuring the electron beam profile in the far-field, this method allows the characterization of ultra-low emittance beams. 2D PIC simulations are performed using a parameter range of $e_n=[0.01,1]$ $\pi$ $mm$ $mrad$. We discuss several application scenarios for the characterization of ultra-low emittance beams.

Working group Laser-driven electron acceleration

Primary author

Mr Andreas Seidel (Friedrich-Schiller-Universität)


Dr Christian Rödel (Helmholtz-Institut Jena) Prof. Matt Zepf (Helmholtz-Institut Jena)

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